Understand and operate test lab equipment (prober, probe card analyzer, test benches, etc.) required for probe card characterization and optical inspection.
Define and execute statistical-proven experiments to determine probe wear-out rates, to stabilize contact resistance and to control tip diameter for various probe-pad-combinations of Infineon’s power and digital wafer technologies.
Track probe card performance at productive test sites and support them optimizing yield, extending lifetime and reducing maintenance cycle times.
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